Determination of optical parameters and thickness of weakly absorbing thin films from reflectance and transmittance spectra

Applied Optics

Volumn 45, Issue 19, 2006, Pages 4547-4553

  Kutavichus, Vitaly P ^a   Filippov, Valery V ^a   Huzouski, Vitali H ^b  

^a B I STEPANOV INSTITUTE OF PHYSICS   (Belarus)

^b INSTITUTE FOR MATHEMATICS   (Belarus)

Author keywords

[No Author keywords available]

Indexed keywords

INVERSE PROBLEMS; OPTICAL VARIABLES MEASUREMENT; PROBLEM SOLVING; REFLECTION; SPECTROPHOTOMETRY; SPECTRUM ANALYSIS;

GLASS SUBSTRATE; OPTICAL CONSTANTS; PROGRAMMED REALIZATION; TRANSMITTANCE SPECTRA;

THIN FILMS;

EID: 33746165243     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.45.004547     Document Type: Article

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