Size determination by use of two-dimensional Mueller matrices backscattered by optically thick random media

Applied Optics

Volumn 45, Issue 19, 2006, Pages 4669-4678

  Dillet, Jérôme ^a   Baravian, Christophe ^a   Caton, François ^a   Parker, Alan ^b  

^a CNRS   (France)

^b Analysis and Perception Department   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTROMAGNETIC WAVE BACKSCATTERING; INVERSE PROBLEMS; LIGHT POLARIZATION; MATRIX ALGEBRA; MONTE CARLO METHODS; REFRACTIVE INDEX;

MICROSCOPIC PARAMETERS; MUELLER MATRICES; OPTICALLY THICK RANDOM MEDIA; TWO-DIMENSIONAL MUELLER MATRICES;

OPTICAL SYSTEMS;

EID: 33746156511     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.45.004669     Document Type: Article

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