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Volumn 36, Issue 2 A, 2006, Pages 324-327

Characterization of SnTe films grown by molecular beam epitaxy

Author keywords

BaF2 substrates; Molecular beam epitaxy; SnTe

Indexed keywords


EID: 33746088824     PISSN: 01039733     EISSN: 01039733     Source Type: Journal    
DOI: 10.1590/S0103-97332006000300024     Document Type: Conference Paper
Times cited : (21)

References (16)
  • 13
    • 0004071855 scopus 로고
    • edited by F. R. N. Nabarro (North-Holland Publ. Co)
    • J. W. Matthews, in Dislocation in Solids, edited by F. R. N. Nabarro (North-Holland Publ. Co, 1979).
    • (1979) Dislocation in Solids
    • Matthews, J.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.