Selection of embedding dimension and delay time in phase space reconstruction

Frontiers of Electrical and Electronic Engineering in China

Volumn 1, Issue 1, 2006, Pages 111-114

  Ma, Hong Guang ^a   Han, Chong Zhao ^a  

^a XI'AN RESEARCH INSTITUTE OF HIGH TECHNOLOGY   (China)

Author keywords

test; Delay time; Embedding dimension; Multiple autocorrelation; Phase space reconstruction

Indexed keywords

EID: 33746081701     PISSN: 16733460     EISSN: 16733584     Source Type: Journal    
DOI: 10.1088/0957-0233/17/1/018     Document Type: Article

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