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Volumn 932, Issue , 2006, Pages 449-456

Electrochemical, SECM, and XPS studies of the influence of H2 on UO2 nuclear fuel corrosion

Author keywords

[No Author keywords available]

Indexed keywords

OXIDATION; RADIOACTIVE WASTE DISPOSAL; SCANNING ELECTRON MICROSCOPY; SECONDARY ION MASS SPECTROMETRY; URANIUM DIOXIDE; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 33746067887     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-932-75.1     Document Type: Conference Paper
Times cited : (7)

References (15)
  • 14
    • 13844313211 scopus 로고    scopus 로고
    • Bard, A. J., Mirkin, M. V., Eds.; Marcel Dekker, Inc.: New York
    • Wipf, D. O. In Scanning Electrochemical Microscopy; Bard, A. J., Mirkin, M. V., Eds.; Marcel Dekker, Inc.: New York, 2001, pp 17-74.
    • (2001) Scanning Electrochemical Microscopy , pp. 17-74
    • Wipf, D.O.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.