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Volumn 426, Issue 4-6, 2006, Pages 365-369
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The initial mechanisms of Al2O3 atomic layer deposition on OH/Si(1 0 0)-2 × 1 surface by tri-methylaluminum and water
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPLEXATION;
FILM GROWTH;
REACTION KINETICS;
SILICON;
SURFACES;
THERMODYNAMIC STABILITY;
ATOMIC LAYER DEPOSITION;
JUNCTION REGION;
SURFACE BONDING;
WATER PRECURSORS;
ALUMINA;
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EID: 33746067142
PISSN: 00092614
EISSN: None
Source Type: Journal
DOI: 10.1016/j.cplett.2006.05.126 Document Type: Article |
Times cited : (29)
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References (28)
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