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Volumn 45, Issue 16, 2006, Pages 3852-3858

Single-shot measurement of nonlinear absorption and nonlinear refraction

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT ABSORPTION; LIGHT REFRACTION; OPTICAL KERR EFFECT; PHOTONS; REFRACTIVE INDEX;

EID: 33746052078     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.45.003852     Document Type: Article
Times cited : (9)

References (10)
  • 1
  • 4
    • 0024900387 scopus 로고
    • Determination of nonlinear refractive indices by external self-focusing
    • B. Meier and A. Penzkofer, "Determination of nonlinear refractive indices by external self-focusing," Appl. Phys. B 49, 513-519 (1989).
    • (1989) Appl. Phys. B , vol.49 , pp. 513-519
    • Meier, B.1    Penzkofer, A.2
  • 6
    • 0343584258 scopus 로고    scopus 로고
    • Measurement of a nonlinear refractive index with a single laser pulse
    • J. Hein, M. Helbig, and S. Rentsch, "Measurement of a nonlinear refractive index with a single laser pulse," Appl. Opt. 36, 1173-1176 (1997).
    • (1997) Appl. Opt. , vol.36 , pp. 1173-1176
    • Hein, J.1    Helbig, M.2    Rentsch, S.3
  • 7
    • 84975606837 scopus 로고
    • Determination of bound-electronic and free-carrier nonlinearities in ZnSe, GaAs, CdTe, and ZnTe
    • A. A. Said, M. Sheik-Bahae, D. J. Hagan, T. H. Wei, J. Young, and E. W. Van Stryland, "Determination of bound-electronic and free-carrier nonlinearities in ZnSe, GaAs, CdTe, and ZnTe," J. Opt. Soc. Am. B 9, 405-414 (1992).
    • (1992) J. Opt. Soc. Am. B , vol.9 , pp. 405-414
    • Said, A.A.1    Sheik-Bahae, M.2    Hagan, D.J.3    Wei, T.H.4    Young, J.5    Van Stryland, E.W.6
  • 8
    • 84975606562 scopus 로고
    • Self-defocusing in CdSe induced by charge carriers created by two-photon absorption
    • S. Guha, E. W. Van Stryland, and M. J. Soileau, "Self-defocusing in CdSe induced by charge carriers created by two-photon absorption," Opt. Lett. 10, 285-287 (1985).
    • (1985) Opt. Lett. , vol.10 , pp. 285-287
    • Guha, S.1    Van Stryland, E.W.2    Soileau, M.J.3
  • 10
    • 0032661005 scopus 로고    scopus 로고
    • Intensity dependence of Z-scan in semiconductor-doped glasses for separation of third and fifth order contributions in the below band gap region
    • K. S. Bindra, S. M. Oak and K. C. Rustagi, "Intensity dependence of Z-scan in semiconductor-doped glasses for separation of third and fifth order contributions in the below band gap region," Opt. Commun. 168, 219-225 (1999).
    • (1999) Opt. Commun. , vol.168 , pp. 219-225
    • Bindra, K.S.1    Oak, S.M.2    Rustagi, K.C.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.