Surface residual stress measurement using curvature interferometry

Experimental Mechanics

Volumn 46, Issue 1, 2006, Pages 39-46

  Wang, J ^a   Shrotriya, P ^b   Kim, K S ^c  

^a University of California Riverside   (United States)

^b Iowa State University of Science and Technology   (United States)

^c Brown University   (United States)

Author keywords

Contact loading; Curvature interferometer; Residual stress; Rough surface

Indexed keywords

COMPRESSIVE STRESS; DELAMINATION; DISLOCATIONS (CRYSTALS); INTERFEROMETRY; NUCLEATION; POLYCRYSTALLINE MATERIALS; STRESS CONCENTRATION; SURFACE ROUGHNESS; TENSILE STRESS; WEAR OF MATERIALS;

CONTACT LOADING; CURVATURE INTERFEROMETER; ROUGH SURFACE;

RESIDUAL STRESSES;

COMPRESSIVE STRESS; DELAMINATION; DISLOCATIONS (CRYSTALS); INTERFEROMETRY; NUCLEATION; POLYCRYSTALLINE MATERIALS; RESIDUAL STRESSES; STRESS CONCENTRATION; SURFACE ROUGHNESS; TENSILE STRESS; WEAR OF MATERIALS;

EID: 33746036532     PISSN: 00144851     EISSN: 17412765     Source Type: Journal    
DOI: 10.1007/s11340-006-5864-3     Document Type: Article

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