A new analytical model and the impact of base charge storage on base potential distribution, emitter current crowding and base resistance

Technical Digest - International Electron Devices Meeting, IEDM

Volumn 1992-December, Issue , 1992, Pages 573-576

  Chiu, Tzu Yin ^a   Tien, P K ^a   Sung, Janmye ^a   Liu, T Y M ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BASE RESISTANCE; BASE TRANSIT TIME; COLLECTOR CURRENTS; CROWDING EFFECTS; EMITTER CURRENTS; EXCESS CARRIERS; LINEAR FUNCTIONS; POTENTIAL DISTRIBUTIONS;

ELECTRON DEVICES;

EID: 33745978497     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEDM.1992.307427     Document Type: Conference Paper

References (9)

1. T. Y. Chiu, T. Y. M. Liu, K. F. Lee, pp. 158, BCTM, 91
2. J. R. Hauser, IEEE, ED-1 1, no. 5, pp. 238-242, May, 1964
3. R. C. Taft, J. D. Plummer, IEEE, ED-38, pp. 2139, Sep., 1991
4. H. N. Ghosh, IEEE, ED-12, pp. 513, Oct., 1965
5. M. Jo, D. E. Bwk, IEEE, ED-37, pp. 202, Jan. 1990
6. M. Schroeter, IEEE, ED-38, pp. 538, Mar., 1991
7. J. Yuan, J. J Liou, W. R. Eisenstadt, IEEE, ED-35, pp. 1055, Jul., 1988
8. R. E. Lowther, IEEE, ED-38, pp. 518, Mar., 1991
9. S. K. Ghandi, The Theory and Practice of Microelectronics, John Wiley, New York, 1968