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Volumn 249, Issue 1-2 SPEC. ISS., 2006, Pages 355-357

Oxygen depth profiling by resonant RBS in NiTi after plasma immersion ion implantation

Author keywords

Diffusion; NiTi; PIII; RBS; Rutile

Indexed keywords

BIOTECHNOLOGY; DIFFUSION; ION IMPLANTATION; PLASMAS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; TITANIUM DIOXIDE;

EID: 33745961717     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2006.04.027     Document Type: Article
Times cited : (9)

References (15)
  • 10
    • 33745948070 scopus 로고    scopus 로고
    • S. Mändl, A. Fleischer, D. Manova, B. Rauschenbach, Surf. Coat. Technol., in press, doi:10.1016/j.surfcoat.2005.11.070.
  • 12
    • 0003419936 scopus 로고
    • Tesmer J.R., and Nastasi M. (Eds), Materials Research Society
    • In: Tesmer J.R., and Nastasi M. (Eds). Handbook of Modern Ion Beam Materials Analysis (1995), Materials Research Society
    • (1995) Handbook of Modern Ion Beam Materials Analysis
  • 13
    • 33745943735 scopus 로고    scopus 로고
    • M. Kitzing, Diploma thesis, University of Leipzig, 2005.
  • 14
    • 33745936703 scopus 로고    scopus 로고
    • S. Mändl, M. Schubert, Appl. Phys. Lett., submitted for publication.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.