Mechanical-electrical characterization of carbon-nanotube thin films for structural monitoring applications

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6174 I, Issue , 2006, Pages

  Loh, Kenneth J ^a   Lynch, Jerome P ^a   Kotov, Nicholas A ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

Carbon nanotubes; Layer by Layer assembly; Nanotechnology; Strain gauges; Structural monitoring

Indexed keywords

CARBON NANOTUBES; CONDITION MONITORING; DEFORMATION; POLYELECTROLYTES; SELF ASSEMBLY; SENSORS; STRAIN MEASUREMENT;

BULK STRAIN SENSOR; LAYER-BY-LAYER ASSEMBLY; POLYELECTROLYTE CONCENTRATION; STRUCTURAL MONITORING;

THIN FILMS;

EID: 33745955808     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.658896     Document Type: Conference Paper

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