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Volumn 249, Issue 1-2 SPEC. ISS., 2006, Pages 734-737
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Quantitative trace element analysis with sub-micron lateral resolution
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Author keywords
PIXE; Sub micron; Trace element analysis
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Indexed keywords
DIAPHRAGMS;
NEUROLOGY;
PIGMENTS;
TRACE ANALYSIS;
ELEMENTAL ANALYSIS;
PIXE;
SUB-MICRONS;
TRACE ELEMENT ANALYSIS;
TRACE ELEMENTS;
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EID: 33745954564
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nimb.2006.03.129 Document Type: Article |
Times cited : (16)
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References (15)
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