Inspection of defects in conductive multi-layered structures by an eddy current scanning technique: Simulation and experiments

NDT and E International

Volumn 39, Issue 7, 2006, Pages 578-584

  Huang, Pingjie ^a   Zhang, Guangxin ^a   Wu, Zhaotong ^a   Cai, Jinhui ^a   Zhou, Zekui ^a  

^a ZHEJIANG UNIVERSITY   (China)

Author keywords

Characterization; Defect; Eddy current testing; Finite element analysis; Multi layered structures

Indexed keywords

COMPUTER SIMULATION; COMPUTER SOFTWARE; CONDUCTIVE MATERIALS; DEFECTS; EDDY CURRENTS; FINITE ELEMENT METHOD; PROBLEM SOLVING;

ANSYS SOFTWARE; EDDY CURRENT SCANNING TECHNIQUES; INVERSION MODEL; MULTI LAYERED STRUCTURES;

STRUCTURAL DESIGN;

EID: 33745954029     PISSN: 09638695     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ndteint.2006.04.004     Document Type: Article

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