Development of DSP-based electromechanical (E/M) impedance analyzer for active structural health monitoring

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6174 I, Issue , 2006, Pages

  Xu, Buli ^a   Giurgiutiu, Victor ^a  

^a The Department of Mechanical Engineering   (United States)

Author keywords

DSP; Impedance analyzer; Impedance measurement; Piezoelectric wafer active sensors; PWAS; Structural health monitoring

Indexed keywords

DSP; IMPEDANCE ANALYZER; IMPEDANCE MEASUREMENT; PIEZOELECTRIC WAFER ACTIVE SENSORS; PWAS; STRUCTURAL HEALTH MONITORING;

PERSONAL COMPUTERS; PIEZOELECTRIC MATERIALS; SENSORS; SILICON WAFERS; STRUCTURAL ANALYSIS;

ELECTROMECHANICAL DEVICES;

EID: 33745951680     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.657507     Document Type: Conference Paper

References (8)

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