Interface mixing and magnetism in Ni/Si bilayers irradiated with swift and low-energy heavy ions

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 249, Issue 1-2 SPEC. ISS., 2006, Pages 167-171

  Zhang, K ^a   Lieb, K P ^a   Milinovic, V ^a   Uhrmacher, M ^a   Klaumunzer S ^b  

^a UNIVERSITY OF GÖTTINGEN   (Germany)

^b HAHN MEITNER INSTITUT   (Germany)

Author keywords

Heavy ion irradiation; Ion beam mixing; Magnetization; Silicide formation

Indexed keywords

HEAVY IONS; INTERFACES (MATERIALS); MAGNETIZATION; OPTICAL KERR EFFECT; RUTHERFORD BACKSCATTERING SPECTROSCOPY; X RAY DIFFRACTION;

HEAVY ION IRRADIATION; INTERFACE MIXING; ION BEAM MIXING; SILICIDE FORMATION;

NICKEL COMPOUNDS;

EID: 33745951666     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2006.03.106     Document Type: Article

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