Exploring advantages of 4He-PIXE analysis for layered objects in cultural heritage

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 249, Issue 1-2 SPEC. ISS., 2006, Pages 604-607

  Rohrs S ^a   Calligaro, T ^a   Mathis, F ^a   Ortega Feliu, I ^b   Salomon, J ^a   Walter, P ^a  

^a CENTRE DE RECHERCHE ET DE RESTAURATION DES MUSÉES DE FRANCE   (France)

^b CENTRO NACIONAL DE ACELERADORES   (Spain)

Author keywords

Analytic; Bremsstrahlung; Cultural heritage; Helium beam; PIXE; X ray yield

Indexed keywords

HELIUM; PROTONS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SIGNAL TO NOISE RATIO; X RAYS;

ANALYTIC; BREMSSTRAHLUNG; CULTURAL HERITAGE; HELIUM BEAM; PIXE; X-RAY YIELD;

PARTICLE BEAMS;

EID: 33745941595     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2006.03.065     Document Type: Article

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