Electron cloud size measurement in silicon drift detectors and spatial resolution improvement

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 564, Issue 1, 2006, Pages 475-481

  Crescio, E ^a   Nouais, D ^a  

^a SEZIONE DI TORINO   (Italy)

Author keywords

Diffusion; Resolution improvement; Silicon drift detectors

Indexed keywords

CLOUDS; DATA REDUCTION; DIFFUSION; LIGHT; MEASUREMENT THEORY; OPTICAL RESOLVING POWER; SILICON; SYSTEMATIC ERRORS;

CLOUD SIZE; HIGH PRECISION MEASUREMENT; RESOLUTION IMPROVEMENT; SILICON DRIFT DETECTORS;

ELECTRONS;

EID: 33745930810     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2006.04.077     Document Type: Article

References (3)

1. Gatti E., and Rehak P. Nucl. Instr. and Meth. A 225 (1984) 608
2. Gatti E., et al. Nucl. Instr. and Meth. A 253 (1987) 393
3. Turchetta R. Nucl. Instr. and Meth. A 335 (1993) 44