A design and test technique for embedded software

Proceedings - Third ACIS International Conference on Software Engineering Research, Management and Applications, SERA 2005

Volumn 2005, Issue , 2005, Pages 160-165

  Kang, Byeongdo ^a   Kwon, Young Jik ^a   Lee, Roger Y ^b  

^a Daegu University   (South Korea)

^b CENTRAL MICHIGAN UNIVERSITY   (United States)

Author keywords

Embedded Software; Software Design; Software Test

Indexed keywords

EMBEDDED SYSTEMS; ERROR ANALYSIS; LARGE SCALE SYSTEMS; SOFTWARE ENGINEERING;

EMBEDDED SOFTWARE; SOFTWARE ARCHITECTURE; SOFTWARE DESIGN; SOFTWARE TESTS;

COMPUTER SOFTWARE;

EID: 33745889713     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SERA.2005.6     Document Type: Conference Paper

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