Correction of X-ray detection yield in micro-PIXE analysis according to sample thickness variation measured by STIM

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 249, Issue 1-2 SPEC. ISS., 2006, Pages 234-237

  Satoh, T ^a   Sakai, T ^a   Oikawa, M ^a  

^a JAPAN ATOMIC ENERGY AGENCY   (Japan)

Author keywords

Micro PIXE; STIM

Indexed keywords

CELLS; CODES (SYMBOLS); COMPUTER SIMULATION; DEMODULATION; ERROR ANALYSIS; GRANULATION; MICROSCOPIC EXAMINATION; REDUCTION; THICKNESS CONTROL;

COMPUTER CALCULATION CODES; MICRO-PIXE; SCANNING TRANSMISSION ION MICROSCOPY (STIM); THICKNESS DISTRIBUTION;

X RAY ANALYSIS;

EID: 33745853520     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2006.04.005     Document Type: Article

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