In-air PIXE analysis by means of glass capillary optics

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 249, Issue 1-2 SPEC. ISS., 2006, Pages 226-229

  Nebiki, Takuya ^a   Kabir, M Hasnat ^a   Narusawa, Tadashi ^a  

^a KOCHI UNIVERSITY OF TECHNOLOGY   (Japan)

Author keywords

Environmental pollutions; Glass capillary optics; In air measurements; PIXE

Indexed keywords

CAPILLARITY; ENVIRONMENTAL IMPACT; GLASS; ION BEAMS; OPTICAL PUMPING; POLLUTION; X RAY ANALYSIS;

ENVIRONMENTAL POLLUTION; GLASS CAPILLARY OPTICS; IN-AIR MEASUREMENTS; PIXE;

OPTICAL DEVICES;

EID: 33745847806     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2006.04.003     Document Type: Article

References (7)

1. In: Johansson S.A.E., Campbell J.L., and Malmqvist K.G. (Eds). Particle-Induced X-ray Emission Spectrometry (PIXE) (1995), Wiley & Sons, New York
2. Räisänen J. Nucl. Instr. and Meth. 231 (1984) 220
3. J.L. Ruvalcaba Sil, M. Monroy, J.G. Morales, K. López, in: IX International Conference on PIXE, Guelph, Canada, 2001.
4. Vijayan V., Choudhury R.K., Mallick B., Sahu S., Choudhury S.K., Lenka H.P., Rautray T.R., and Nayak P.K. Curr. Sci. 85 6 (2003) 772
5. Nebiki T., Yamamoto T., Narusawa T., Breese M.B.H., Teo E.J., and Watt F. J. Vac. Sci. Technol. A 21 (2003) 1671
6. Stolterfoht N., Bremer J.-H., Hoffmann V., Hellhammer R., Fink D., Petrov A., and Sulik B. Phys. Rev. Lett. 88 (2002) 133201-1
7. J.F. Ziegler, Range of Ions in Matter. Available from: .