Ion beam analysis of Cs-implanted zirconia and spinel

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 249, Issue 1-2 SPEC. ISS., 2006, Pages 326-329

  Thome L ^a   Gentils, A ^a,b   Enescu, S E ^a,c   Khodja, H ^d   Thome T ^d,e  

^a 91405 Orsay Campus   (France)

^b UNIVERSITY OF GLASGOW   (United Kingdom)

^c HORIA HULUBEI NATIONAL INSTITUTE OF PHYSICS AND NUCLEAR ENGINEERING   (Romania)

^d CEA SACLAY   (France)

^e UNIVERSITY OF NAMUR   (Belgium)

Author keywords

AFM; Annealing; Ion implantation; Microprobe; RBS; Spinel; Zirconia

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; CRYSTALLOGRAPHY; DESORPTION; FISSION PRODUCTS; ION BEAMS; ION IMPLANTATION; LOW TEMPERATURE EFFECTS; MAGNESIUM COMPOUNDS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SINGLE CRYSTALS; THERMAL EFFECTS; YTTRIUM COMPOUNDS;

EXFOLIATION; MAGNESIUM ALUMINATE SPINEL (MAS); MICROPROBE; SPINEL;

ZIRCONIA;

EID: 33745825942     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2006.04.060     Document Type: Article

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