Thermal diffusivity and electron transport properties of NTC samples obtained by the photoacoustic method

Materials Science and Engineering: B

Volumn 131, Issue 1-3, 2006, Pages 216-221

  Savic S M ^a   Aleksic O S ^b   Nikolic M V ^b   Lukovic D T ^a   Pejović, V Ž ^b   Nikolic P M ^a  

^a INSTITUTE OF TECHNICAL SCIENCES   (Serbia)

^b UNIVERSITY OF BELGRADE   (Serbia)

Author keywords

Ceramics; Electron microscopy; Thermal diffusion

Indexed keywords

ELECTRON MICROSCOPY; ELECTRON TRANSITIONS; MIXTURES; PHOTOACOUSTIC EFFECT; POWDERS; SINTERING; THERMAL DIFFUSION;

ELECTRON TRANSPORT PARAMETERS; POWDER MIXTURES; SINTERING TEMPERATURE; SINTERING TIME;

CERAMIC MATERIALS;

EID: 33745817848     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2006.04.035     Document Type: Article

References (16)

1. Macklen E.D. Thermistors (1979), Electrochemical Publications Limited, Ayr, Scotland
2. Aleksić O.S., Nikolić P.M., Simić M., Pejović V.Z., and Vasiljević-Radović D.G. In: Stojanovic B., Skorohod V., and Nikolic M.V. (Eds). Advanced Science Technology of Sintering (1999), Kluwer Academic Plenum Publishers, New York pp. 425-430
3. Aleksić O.S., Nikolić P.M., Luković D., Savić S., Pejović V.Z., and Radojičić B.M. Proceedings of 24th International Conference on Microelectronics, MIEL, vol. 1 (2004) 185-189
4. Sachse H.B. Semiconducting Temperature Sensors and Their Applications (1975), Wiley, New York
5. O.S. Aleksić, P.M. Nikolić, K.M. Paraskevopoulos, Microelectron. Int., accepted for publication, 2006.
6. Buchanan R.C. Ceramic Materials for Electronics (1986), Dekker, New York and Basel
7. Sasamoto T., Meguro T., Yokoyama T., Abe Y., and Torikai M. Key Eng. Mater. 53-55 (1991) 101-104
8. Rosencwaig A., and Gersho A. J. Appl. Phys. 47 (1976) 64-69
9. Todorovic D.M., and Nikolic P.M. Opt. Eng. 36 (1997) 432-445
10. Nikolic P.M., Todorovic D.M., Vasiljevic D.G., Mihajlovic P., Radulovic K., Ristovski Z., Elazar J., Blagojevic V., and Dramicanin M.D. Microelectron. J. 27 6 (1996) 459-469
11. Schmidt R., Basu A., and Brinkman A.W. Phys. Rev. B 72 (2005) 115101-115109
12. Abe Y., Meguro T., Yokoyama T., Morita T., Tatami J., and Komeya K. J. Ceram. Process. Res. 4 3 (2003) 140-144
13. Na E.S., Paik U.G., and Choi S.C. J. Ceram. Process. Res. 2 (2001) 31-34
14. Asbrink S., Waskowska A., Drozd M., and Talik E. J. Phys. Chem. Solids 58 (1997) 725-729
15. Aleksic O.S., Nikolic P.M., Lukovic D., Radulovic K., Vaseljevic-Radovic D., and Savic S. Microelectron. Int. 21 1 (2004) 10-14
16. Aleksic O.S., Nikolic P.M., Lukovic D., Savic S., Vasiljevic-Radovic D., Radulovic K., Lukic L., Bojičic A., and Uroševic D. J. Phys. IV France 125 (2005) 431-433