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Volumn 203, Issue 8, 2006, Pages 2078-2082

Magnetic domain walls at the edge of patterned NiO/NiFe bilayers

Author keywords

[No Author keywords available]

Indexed keywords

CHARGED WALL; EXCHANGE BIASING FIELD (HEX); MFM; NUCLEATION SITE; PINNING SITE;

EID: 33745782281     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200521168     Document Type: Article
Times cited : (2)

References (10)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.