Scattering of a tightly focused beam by an optically trapped particle

Applied Optics

Volumn 45, Issue 15, 2006, Pages 3634-3645

  Lock, James A ^a   Wrbanek, Susan Y ^b   Weiland, Kenneth E ^b  

^a CLEVELAND STATE UNIVERSITY   (United States)

^b NASA GLENN RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTIVE OPTICS; ELECTROMAGNETIC WAVE DIFFRACTION; ELECTROMAGNETIC WAVE SCATTERING; ELEMENTARY PARTICLES; MOIRE FRINGES;

LIGHT INTENSITY; NEAR-FORWARD SCATTERING; OPTICALLY TRAPPED PARTICLE; TIGHTLY FOCUSED BEAM;

PARTICLE BEAMS;

EID: 33745773054     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.45.003634     Document Type: Article

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