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Volumn 97, Issue 1, 2006, Pages
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Wetting and contact lines of micrometer-sized ellipsoids
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRON LENSES;
INTERFEROMETRY;
MICROSTRUCTURE;
OPTICAL ENGINEERING;
SURFACE PROPERTIES;
WETTING;
ELLIPSOIDS;
MICROSCOPIC SURFACE PROPERTIES;
QUADRUPOLAR SYMMETRY;
WATER-AIR INTERFACE;
POLYSTYRENES;
MICROSPHERE;
POLYSTYRENE DERIVATIVE;
ARTICLE;
CHEMICAL MODEL;
CHEMICAL STRUCTURE;
CHEMISTRY;
COMPUTER SIMULATION;
MECHANICAL STRESS;
PARTICLE SIZE;
WETTABILITY;
COMPUTER SIMULATION;
MICROSPHERES;
MODELS, CHEMICAL;
MODELS, MOLECULAR;
PARTICLE SIZE;
POLYSTYRENES;
STRESS, MECHANICAL;
WETTABILITY;
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EID: 33745768658
PISSN: 00319007
EISSN: 10797114
Source Type: Journal
DOI: 10.1103/PhysRevLett.97.018304 Document Type: Article |
Times cited : (157)
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References (22)
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