Low-frequency noises as a tool for UV detector characterisation

Opto-Electronics Review

Volumn 14, Issue 2, 2006, Pages 155-160

  Cwirko R ^c   Bielecki, Z ^a   Cwirko J ^a   Dobrzanski L ^b  

^a MILITARY UNIVERSITY OF TECHNOLOGY   (Poland)

^b ukasiewicz Research Network Institute of Microelectronics and Photonics   (Poland)

^c NONE

Author keywords

GaN; Low frequency noise; UV detector

Indexed keywords

ALUMINUM ALLOYS; ALUMINUM GALLIUM NITRIDE; GALLIUM NITRIDE; GALLIUM PHOSPHIDE; III-V SEMICONDUCTORS; SEMICONDUCTOR ALLOYS; SEMICONDUCTOR DETECTORS; SILICON ALLOYS; SILICON CARBIDE; SPURIOUS SIGNAL NOISE; ULTRAVIOLET DETECTORS; WIDE BAND GAP SEMICONDUCTORS;

LOW-FREQUENCY NOISE; MEASUREMENTS OF; MEASURING SYSTEMS; NOISE CHARACTERISTIC; SUPPLY VOLTAGES; ULTRA-VIOLET;

GALLIUM ALLOYS;

EID: 33745762995     PISSN: 12303402     EISSN: 18963757     Source Type: Journal    
DOI: 10.2478/s11772-006-0021-1     Document Type: Article

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