Laser threshold of Mie resonances

Optics Letters

Volumn 31, Issue 10, 2006, Pages 1432-1434

  Van Der Molen, Karen L ^a   Zijlstra, Peter ^a   Lagendijk, Ad ^a,b   Mosk, Allard P ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

^b FOM INSTITUTE AMOLF   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MICROSPHERES; LASER THRESHOLD; STANDARD EXTRAPOLATION; TIME-INDEPENDENT SCATTERING;

DIELECTRIC MATERIALS; EXTRAPOLATION; LASERS; LIGHT SCATTERING;

RESONANCE;

EID: 33745747541     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.31.001432     Document Type: Article

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