Modeling probabilities of patent oppositions in a Bayesian semiparametric regression framework

Empirical Economics

Volumn 31, Issue 2, 2006, Pages 513-533

  Jerak, Alexander ^a   Wagner, Stefan ^a  

^a UNIVERSITY OF MUNICH   (Germany)

Author keywords

Bayesian P splines; Bayesian semiparametric binary regression; Markov Chain Monte Carlo; Patent opposition

Indexed keywords

BAYESIAN ANALYSIS; ECONOMETRICS; MARKOV CHAIN; MODELING; MONTE CARLO ANALYSIS; NONLINEARITY; PROBABILITY; REGRESSION ANALYSIS;

EID: 33745746378     PISSN: 03777332     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00181-005-0047-0     Document Type: Review

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