New approach for measuring the microwave Hall mobility of semiconductors

Review of Scientific Instruments

Volumn 77, Issue 6, 2006, Pages

  Murthy, D V B ^a   Subramanian, V ^a   Murthy, V R K ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY MADRAS   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; CALIBRATION; CARRIER MOBILITY; ERROR ANALYSIS;

ANISOTROPIC MOBILITY; BIMODAL CAVITY; CALIBRATION CONSTANT; HALL MOBILITY;

SEMICONDUCTOR MATERIALS;

EID: 33745728126     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2213167     Document Type: Article

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