Single-metal-cluster local imaging: Polarized scattered electric field calculation compared to the field's modulus and phase observed in the optical near-field

Applied Physics B: Lasers and Optics

Volumn 84, Issue 1-2, 2006, Pages 167-173

  Gresillon S ^a   Lecaque, R ^a   Williame, L ^a   Rivoal, J C ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD EFFECTS; GOLD; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OPTICAL PROPERTIES; PARTICLES (PARTICULATE MATTER); SCATTERING PARAMETERS;

MIE FORMALISM; NEAR-FIELD OPTICAL IMAGING; PLASMON RESONANCE; SINGLE METAL CLUSTERS;

IMAGING TECHNIQUES;

EID: 33745698642     PISSN: 09462171     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00340-006-2232-z     Document Type: Article

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