|
Volumn 77, Issue 6, 2006, Pages
|
Simple and inexpensive time-of-flight charge-to-mass analyzer for ion beam source characterization
b
EGE UNIVERSITY
(Turkey)
|
Author keywords
[No Author keywords available]
|
Indexed keywords
CHARGE-TO-MASS ANALYZER;
ION VELOCITY;
ELECTRONIC EQUIPMENT;
PRODUCT DESIGN;
VELOCITY MEASUREMENT;
ION BEAMS;
|
EID: 33745685899
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2206778 Document Type: Article |
Times cited : (79)
|
References (16)
|