Study of DCPD analyzing method of energy-storage capacitors

Diangong Jishu Xuebao/Transactions of China Electrotechnical Society

Volumn 21, Issue 4, 2006, Pages 46-49

  Ran, Hanzheng ^a   Wu, Guangning ^a   Shu, Wen ^a   Zhang, Xueqin ^a   Yu, Chenglong ^b   Liu, Huachang ^b  

^a SOUTHWEST JIAOTONG UNIVERSITY   (China)

^b RESEARCH CENTER OF LASER FUSION   (China)

Author keywords

Aging; DC; Partial discharge (PD); Signal analyzing

Indexed keywords

AGING OF MATERIALS; ELECTRIC ENERGY STORAGE; ELECTRIC INSULATION; PARTIAL DISCHARGES;

DIRECT CURRENT; SIGNAL ANALYZING;

PAPER CAPACITORS;

EID: 33745654324     PISSN: 10006753     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (5)

1. Hoogenraad G, Beyer J. Digital HVDC partial discharge testing. Conference Record of the 2000 IEEE International Symposium on Electrical Insulation, 2000: 448-451
2. Fromm U. Interpretation of partial discharges at DC voltages. IEEE Transaction on Dielectrics and Electrical Insulation, 1995, 2: 761-770
3. Fromm U, Morshuis P H F. Partial discharge classification at DC voltages. 1995 IEEE International Conference on Conduction and Breakdown of Solid Dielectrics, 1995, 403-407
4. Peter Morshuis. Unraveling the physics behind partial discharge PD data. Conference Record of the IEEE International Symposium on Electrical Insulation, 1996