Effect of ion nitriding on the crystal structure of 3 mol% Y 2 O 3 -doped ZrO 2 thin-films prepared by the sol-gel method

Applied Surface Science

Volumn 252, Issue 17, 2006, Pages 6018-6021

  Ortiz, A L ^a   Diaz Parralejo A ^a   Borrero Lopez O ^a   Guiberteau, F ^a  

^a UNIVERSITY OF EXTREMADURA   (Spain)

Author keywords

Crystal structure; Ion nitriding; Sol gel; X ray diffractometry; Zirconia thin films

Indexed keywords

COMPOSITION; CRYSTALLIZATION; DIFFRACTOMETERS; DOPING (ADDITIVES); GRAIN SIZE AND SHAPE; IONIZATION; LATTICE CONSTANTS; NITRIDING; SOL-GELS; STOICHIOMETRY; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

ION NITRIDING; SOL-GEL METHOD; STOICHIOMETRIC FORMULA; ZIRCONIA THIN-FILMS;

CRYSTAL STRUCTURE;

EID: 33745652079     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2005.11.015     Document Type: Article

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