Characterization of multiple disease systems and cultivar susceptibilities for the analysis of yield losses in winter wheat

Crop Protection

Volumn 25, Issue 9, 2006, Pages 1013-1023

  Zhang, X Y ^a   Loyce, C ^a   Meynard, J M ^b   Savary, S ^c  

^a AGROPARISTECH   (France)

^b CEMAGREF   (France)

^c BORDEAUX SCIENCES AGRO   (France)

Author keywords

Cluster analysis; Correspondence analysis; Host plant susceptibility; Multiple disease system; Winter wheat; Yield loss assessment

Indexed keywords

CROP YIELD; CULTIVAR; DISEASE RESISTANCE; FUNGAL DISEASE; WHEAT;

EURASIA; EUROPE; FRANCE; WESTERN EUROPE;

TRITICUM AESTIVUM;

EID: 33745652054     PISSN: 02612194     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cropro.2006.01.013     Document Type: Article

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