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Volumn 6151 II, Issue , 2006, Pages
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Characterization of striae in ULE® for EUVL optics and masks
a a a a a |
Author keywords
Birefringence; EUVL; Frequency; Photomasks; Retardation; Spatial frequency roughness; Striae; Titania; ULE
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Indexed keywords
BIREFRINGENCE;
GLASS;
MASKS;
NATURAL FREQUENCIES;
PHOTOLITHOGRAPHY;
ULTRAVIOLET RADIATION;
EUVL;
PHOTOMASKS;
RETARDATION;
SPATIAL FREQUENCY ROUGHNESS;
STRIAE;
ULE;
LASER OPTICS;
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EID: 33745630639
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.656355 Document Type: Conference Paper |
Times cited : (8)
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References (6)
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