Hysteretic phenomena in Xe-doped C60 from x-ray diffraction

Low Temperature Physics

Volumn 31, Issue 5, 2005, Pages 445-448

  Prokhvatilov, A I ^a   Galtsov, N N ^a   Legchenkova, I V ^a   Strzhemechny, M A ^a   Cassidy, D ^b   Gadd, G E ^b   Moricca, S ^b   Sundqvist, B ^c   Aksenova, N A ^d  

^a B VERKIN INSTITUTE FOR LOW TEMPERATURE PHYSICS AND ENGINEERING   (Ukraine)

^b AUSTRALIAN NUCLEAR SCIENCE AND TECHNOLOGY ORGANISATION   (Australia)

^c UMEÅ UNIVERSITY   (Sweden)

^d Rail Way Transport Academy ^*  (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALS; GLASS; HYSTERESIS; THERMAL EXPANSION;

CHARACTERISTIC TEMPERATURE; HYSTERETIC PHENOMENA; INTEGRATED INTENSITIES; OCTAHEDRAL INTERSTITIAL SITE; OCTAHEDRAL SITES; ORIENTATIONAL PHASE TRANSITION; POWDER X RAY DIFFRACTION; TEMPERATURE RANGE;

X RAY DIFFRACTION;

EID: 33745629629     PISSN: 1063777X     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1925372     Document Type: Article

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