Variance component models for longitudinal count data with baseline information: Epilepsy data revisited

Statistics and Computing

Volumn 16, Issue 3, 2006, Pages 231-238

  Alfò, Marco ^a   Aitkin, Murray ^b,c  

^a SAPIENZA UNIVERSITY OF ROME   (Italy)

^b NEWCASTLE UNIVERSITY   (United Kingdom)

^c UNIVERSITY OF SYDNEY   (Australia)

Author keywords

Baseline measure; Endogeneity bias; Nonparametric maximum likelihood (NPML) estimation; Random effects; Repeated count data; Serial dependence

Indexed keywords

EID: 33745617115     PISSN: 09603174     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11222-006-7072-5     Document Type: Article

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