Low-temperature microhardness of Xe-intercalated fullerite C60

Low Temperature Physics

Volumn 31, Issue 5, 2005, Pages 454-458

  Fomenko, L S ^a   Lubenets, S V ^a   Natsik, V D ^a   Cassidy, D ^b   Gadd, G E ^b   Moricca, S ^b   Sundqvist, B ^c  

^a B VERKIN INSTITUTE FOR LOW TEMPERATURE PHYSICS AND ENGINEERING   (Ukraine)

^b AUSTRALIAN NUCLEAR SCIENCE AND TECHNOLOGY ORGANISATION   (Australia)

^c UMEÅ UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

SINGLE CRYSTALS; TEMPERATURE DISTRIBUTION; THERMAL EXPANSION;

C60 SINGLE CRYSTALS; INTERSTITIAL ATOMS; LOW TEMPERATURES; LOWER TEMPERATURES; ORIENTATIONAL PHASE TRANSITION; TEMPERATURE DEPENDENCE; VICKERS MICROHARDNESS; X-RAY DIFFRACTION DATA;

MICROHARDNESS;

EID: 33745611801     PISSN: 1063777X     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1925374     Document Type: Article

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