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Applied Physics Letters

Volumn 58, Issue 25, 1991, Pages 2921-2923

Kelvin probe force microscopy

(3) Nonnenmacher, M a O'Boyle, M P a Wickramasinghe, H K a

a IBM T J WATSON RESEARCH CENTER (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33745604763 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.105227 Document Type: Article

Times cited : (2072)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.