Gray-scale thinning algorithm using local min/max operations

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

Volumn 3872 LNCS, Issue , 2006, Pages 62-70

  Kim, Kyoung Min ^a,b   Lee, Buhm ^b   Choi, Nam Sup ^b   Kang, Gwan Hee ^b   Park, Joong Jo ^a,c   Suen, Ching Y ^a  

^a Civil and Environmental Engineering   (Canada)

^b Chonnam National University   (South Korea)

^c Gyeongsang National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE ANALYSIS; IMAGING SYSTEMS; INFORMATION ANALYSIS;

DILATION; GRAY-SCALE THINNING ALGORITHMS;

LEARNING ALGORITHMS;

EID: 33745533620     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/11669487_6     Document Type: Conference Paper

References (8)

1. L. Lam, S. W. Lee and C. Y. Suen,: Thinning Methodologies - A Comprehensive Survey, IEEE Trans. Pattern Analysis and Machine Intelligence, 14 (1992) 869-885
2. V. K. Govindan and A. P. Shivaprasad: A pattern adaptive thinning algorithm, Pattern Recognition, 20 (1987) 623-637
3. T. Y. Zhang and C. Y. Suen: A fast parallel algorithm for thinning digital patterns, Comm. of the ACM, 27 (1984) 236-239
4. S. Peleg and A. Rosenfeld: A min-max medial axis transformation, IEEE Trans. Pattern Analysis and Machine Intelligence, 3 (1981) 208-210
5. E. Salari and P. Sly: The Ridge-Seeking Method for Obtaining the Skeleton of Digital Images, IEEE Trans. System, Man, and Cybernetics, 14 (1984) 524-528
6. C. Wang and K. ABE: A Method of Gray-scale Image Thinning : The Case without Region specification for Thinning, IEEE 11th Int. Conf. on Pattern Recognition, 3 (1992) 404-407
7. Y. Nakagawa and A. Rosenfeld: A note on the use of local min and max operations in digital picture processing, IEEE Trans. System, Man, and Cybernetics, 8 (1978) 632-635
8. K. M. Kim, J. J. Park, M. H. Song I. C. Kim and C. Y. Suen: Detection of ridges and ravines using fuzzy logic operations, Pattern Recognition Letters, 25 (2004) 743-751