Phase separation of a Ge2Sb2Te5 alloy in the transition from an amorphous structure to crystalline structures

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 24, Issue 4, 2006, Pages 929-933

  Kim, YoungKuk ^a   Park, S A ^a   Baeck, J H ^a   Noh, M K ^a   Jeong, K ^a   Cho, M H ^b   Park, H M ^b   Lee, M K ^b   Jeong, E J ^a   Ko, D H ^a   Shin, H J ^c  

^a Yonsei University   (South Korea)

^b Korea Research Institute of Standards and Science   (South Korea)

^c POSTECH   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIMONY; ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; DIFFERENTIAL SCANNING CALORIMETRY; GERMANIUM; PHASE SEPARATION; PHASE TRANSITIONS; TELLURIUM; THIN FILMS; X RAY DIFFRACTION;

AMORPHOUS STRUCTURE; CRYSTALLINE STRUCTURES; ELECTRICAL PROPERTIES; SCANNING PHOTOELECTRON MICROSCOPY;

AMORPHOUS ALLOYS;

EID: 33745510483     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2198869     Document Type: Article

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