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Volumn 2005, Issue , 2005, Pages 50-56
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Advanced detection, surveillance, and reconnaissance principles
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Author keywords
Cancer Detection; DOLP; Enhanced Imaging; Homeland Security; Mueller Polarimetric Dual Energy Imaging; Space Exploration; Wafer Semiconductor Inspection
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Indexed keywords
CANCER DETECTION;
DOLP;
ENHANCED IMAGING;
HOMELAND SECURITY;
MUELLER POLARIMETRIC DUAL-ENERGY IMAGING;
SPACE EXPLORATION;
WAFER SEMICONDUCTOR INSPECTION;
BACKSCATTERING;
EMBEDDED SYSTEMS;
OPTICAL SYSTEMS;
POLARIMETERS;
SPECTRUM ANALYSIS;
IMAGING SYSTEMS;
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EID: 33745496337
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/MSHS.2005.1502554 Document Type: Conference Paper |
Times cited : (20)
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References (9)
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