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Volumn 2, Issue , 2004, Pages 291-295
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Properties and utilization of 3D bent-multilayer hybrid structures
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Author keywords
3D multilayer hybrid structures; LTCC
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Indexed keywords
COMPUTER AIDED ANALYSIS;
INTEGRATED CIRCUIT INTERCONNECTS;
MICROPROCESSOR CHIPS;
EXPERIMENTAL ANALYSIS;
INTERCONNECTION RESISTANCE;
LTCC;
MULTI-LAYER HYBRIDS;
MULTILAYER STRUCTURES;
NON-DESTRUCTIVE MEASUREMENT;
PRODUCTION TECHNOLOGY;
THREE-DIMENSIONAL APPLICATIONS;
MULTILAYERS;
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EID: 33745479342
PISSN: 21612528
EISSN: 21612536
Source Type: Conference Proceeding
DOI: 10.1109/ISSE.2004.1490437 Document Type: Conference Paper |
Times cited : (1)
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References (4)
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