Transport properties and defects in silicon nanoparticles and effect of embedding in amorphous silicon layers

Journal of Non-Crystalline Solids

Volumn 352, Issue 9-20 SPEC. ISS., 2006, Pages 1101-1104

  Gueunier Farret, M E ^a   Kleider, J P ^a   Voigt, F ^b   Bruggemann R ^b   Bauer, G H ^b   Huisken, F ^c   Ledoux, G ^c  

^a UNIV PARIS SUD   (France)

^b UNIVERSITY OF OLDENBURG   (Germany)

^c FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

Author keywords

Electrical and electronic properties; Nanoparticles; Silicon

Indexed keywords

DEFECTS; ELECTRONIC PROPERTIES; NANOSTRUCTURED MATERIALS; PYROLYSIS; TRANSPORT PROPERTIES;

AMORPHOUS SILICON LAYERS; LASER PYROLYSIS; SANDWICH STRUCTURE;

AMORPHOUS SILICON;

EID: 33745467516     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2005.11.096     Document Type: Article

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