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Volumn 28, Issue 11, 2006, Pages 1258-1260

Materials modeling for photonic applications

Author keywords

Charge distribution; Electronegativity equalization method; X ray photoelectron spectroscopy

Indexed keywords

LARGE SCALE SYSTEMS; MATHEMATICAL MODELS; OPTICAL PROPERTIES; PROBABILITY DENSITY FUNCTION; PROBLEM SOLVING; REACTION KINETICS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 33745463900     PISSN: 09253467     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optmat.2006.02.013     Document Type: Article
Times cited : (5)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.