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Volumn 28, Issue 11, 2006, Pages 1258-1260
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Materials modeling for photonic applications
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Author keywords
Charge distribution; Electronegativity equalization method; X ray photoelectron spectroscopy
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Indexed keywords
LARGE SCALE SYSTEMS;
MATHEMATICAL MODELS;
OPTICAL PROPERTIES;
PROBABILITY DENSITY FUNCTION;
PROBLEM SOLVING;
REACTION KINETICS;
X RAY PHOTOELECTRON SPECTROSCOPY;
CHARGE DISTRIBUTION;
DESIGNING MATERIALS;
ELECTRONEGATIVITY EQUALIZATION METHOD;
SCHROEDINGER EQUATION;
PHOTONS;
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EID: 33745463900
PISSN: 09253467
EISSN: None
Source Type: Journal
DOI: 10.1016/j.optmat.2006.02.013 Document Type: Article |
Times cited : (5)
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References (11)
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