Single-crystal diffraction and transmission electron microscopy studies of "silicified" pyrochlore from Narssârssuk, Julianehaab district, Greenland

American Mineralogist

Volumn 91, Issue 5-6, 2006, Pages 794-801

  Bonazzi, Paola ^a   Bindi, Luca ^a   Zoppi, Matteo ^a   Capitani, Gian Carlo ^b   Olmi, Filippo ^c  

^a UNIVERSITY OF FLORENCE   (Italy)

^b UNIVERSITY OF SIENA   (Italy)

^c SEZIONE DI FIRENZE   (Italy)

Author keywords

Analysis; Chemical (mineral); Crystal structure; Electron microscopy; Pyrochlore; XRD data

Indexed keywords

AMORPHOUS SILICON; CHEMICAL ANALYSIS; CRYSTAL IMPURITIES; ELECTRON MICROSCOPY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MINERALS; NANOCRYSTALLINE MATERIALS; RADIATION DAMAGE; SILICA; SILICON; SILICON OXIDES; SINGLE CRYSTALS; TRANSMISSIONS;

ANALYSIS; CRYSTALLINE PHASIS; DIFFRACTION PEAKS; LINEAR MULTIPLE REGRESSION; PYROCHLORE-GROUP MINERAL; PYROCHLORES; SINGLE-CRYSTAL DIFFRACTION; UNIT CELL PARAMETERS;

CRYSTAL STRUCTURE;

CRYSTAL STRUCTURE; PARAGENESIS; PYROCHLORE; SILICON; TRANSMISSION ELECTRON MICROSCOPY;

ARCTIC; GREENLAND;

EID: 33745462787     PISSN: 0003004X     EISSN: None     Source Type: Journal    
DOI: 10.2138/am.2006.1777     Document Type: Article

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