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Volumn 14, Issue 13, 2006, Pages 123-129

Absolute distance measurement by dispersive interferometry using a femtosecond pulse laser

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETRY; LASER PULSES; OPTICAL RESOLVING POWER; OPTICAL SYSTEMS;

EID: 33745437245     PISSN: 10944087     EISSN: 10944087     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (99)

References (12)
  • 2
    • 0037103599 scopus 로고    scopus 로고
    • Full range complex spectral optical coherence tomography technique in eye imaging
    • M. Wojtkowski and A. Kowalczyk, "Full range complex spectral optical coherence tomography technique in eye imaging," Opt. Lett. 27, 1415-1417 (2002).
    • (2002) Opt. Lett. , vol.27 , pp. 1415-1417
    • Wojtkowski, M.1    Kowalczyk, A.2
  • 3
    • 0003426303 scopus 로고    scopus 로고
    • High-accuracy measurement of 240-m distance in an optical tunnel by use of a compact femtosecond laser
    • K. Minoshima and H. Matsumoto, "High-accuracy measurement of 240-m distance in an optical tunnel by use of a compact femtosecond laser," Appl. Opt. 39, 5512-5517 (2000).
    • (2000) Appl. Opt. , vol.39 , pp. 5512-5517
    • Minoshima, K.1    Matsumoto, H.2
  • 4
    • 10644254497 scopus 로고    scopus 로고
    • Fiber interferometer for simultaneous multiwavelength phase measurement with a broadband femtosecond laser
    • C. E. Towers, D. P. Towers, D. T. Reid, W. N. MacPherson, R. R. J. Maier, and J. D. C. Jones, "Fiber interferometer for simultaneous multiwavelength phase measurement with a broadband femtosecond laser," Opt. Lett. 29, 2722-2724 (2004).
    • (2004) Opt. Lett. , vol.29 , pp. 2722-2724
    • Towers, C.E.1    Towers, D.P.2    Reid, D.T.3    MacPherson, W.N.4    Maier, R.R.J.5    Jones, J.D.C.6
  • 5
    • 2542420794 scopus 로고    scopus 로고
    • Absolute measurement of a long, arbitrary distance to less than an optical fringe
    • J. Ye, "Absolute measurement of a long, arbitrary distance to less than an optical fringe," Opt. Lett. 29, 1153-1155 (2004).
    • (2004) Opt. Lett. , vol.29 , pp. 1153-1155
    • Ye, J.1
  • 6
    • 0346907001 scopus 로고    scopus 로고
    • Optical frequency combs: From precision frequency metrology to optical phase control
    • J. Ye, H. Schnatz and L. W. Hollberg, "Optical frequency combs: from precision frequency metrology to optical phase control," IEEE J. Sel. Top. Quantum Electron. 9, 1041-1058 (2003).
    • (2003) IEEE J. Sel. Top. Quantum Electron. , vol.9 , pp. 1041-1058
    • Ye, J.1    Schnatz, H.2    Hollberg, L.W.3
  • 7
    • 0038334796 scopus 로고    scopus 로고
    • Femtosecond optical frequency combs
    • S. T. Cundiff and J. Ye, "Femtosecond optical frequency combs," Rev. Mod. Phys. 75, 325-342 (2003).
    • (2003) Rev. Mod. Phys. , vol.75 , pp. 325-342
    • Cundiff, S.T.1    Ye, J.2
  • 8
    • 0028479462 scopus 로고
    • Dispersive interferometric profiler
    • J. Schwider and L. Zhou, "Dispersive interferometric profiler," Opt. Lett. 19, 995-997 (1994).
    • (1994) Opt. Lett. , vol.19 , pp. 995-997
    • Schwider, J.1    Zhou, L.2
  • 9
    • 0015475144 scopus 로고
    • Michelson-type Fourier Spectrometer for the far infrared
    • K. Sakai, "Michelson-type Fourier Spectrometer for the far infrared," Appl. Opt. 11, 2894-2901(1972).
    • (1972) Appl. Opt. , vol.11 , pp. 2894-2901
    • Sakai, K.1
  • 10
    • 84975602254 scopus 로고
    • Linear techniques of phase measurement by femtosecond spectral interferometry for applications in spectroscopy
    • L. Lepetit, G. Chériaux and M. Joffre, "Linear techniques of phase measurement by femtosecond spectral interferometry for applications in spectroscopy," J. Opt. Soc. Am. B 12, 2467-2474 (1995).
    • (1995) J. Opt. Soc. Am. B , vol.12 , pp. 2467-2474
    • Lepetit, L.1    Chériaux, G.2    Joffre, M.3
  • 11
    • 0019927495 scopus 로고
    • Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry
    • M. Takeda, H. Ina and S. Kobayashi, "Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry," J. Opt. Soc. Am. 72, 156-160(1982).
    • (1982) J. Opt. Soc. Am. , vol.72 , pp. 156-160
    • Takeda, M.1    Ina, H.2    Kobayashi, S.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.