Transversal ultrahigh-resolution polarization-sensitive optical coherence tomography for strain mapping in materials

Optics Express

Volumn 14, Issue 13, 2006, Pages 113-121

  Wiesauer, K ^a   Pircher, M ^b   Gotzinger E ^b   Hitzenberger, C K ^b   Engelke, R ^c   Ahrens, G ^c   Grutzner G ^c   Stifter, D ^a  

^a Upper Austrian Research GmbH   (Austria)

^b MEDICAL UNIVERSITY OF VIENNA   (Austria)

^c MICRO RESIST TECHNOLOGY GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CONFORMAL MAPPING; MICROSTRUCTURE; NONDESTRUCTIVE EXAMINATION; OPTICAL RESOLVING POWER; OPTICAL SYSTEMS; TOMOGRAPHY;

MATERIAL CHARACTERIZATION; OPTICAL COHERENCE TOMOGRAPHY (OCT); STRAIN MAPPING;

LIGHT POLARIZATION;

EID: 33745432329     PISSN: 10944087     EISSN: 10944087     Source Type: Journal    
DOI: None     Document Type: Article

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