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Volumn 352, Issue 9-20 SPEC. ISS., 2006, Pages 1348-1351
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Thickness dependence of the structure of a-C:H thin films prepared by rf-CVD evidenced by Raman spectroscopy
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Author keywords
Carbon; Chemical vapor deposition; Diamond like carbon; Raman scattering
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Indexed keywords
AMORPHOUS FILMS;
BENZENE;
CARBON;
CHEMICAL VAPOR DEPOSITION;
HYDROGENATION;
RAMAN SPECTROSCOPY;
SUBSTITUTION REACTIONS;
AMORPHOUS CARBON MATRIX;
BONDING CONFIGURATION;
DIAMOND LIKE CARBON;
ION ENERGIES;
THIN FILMS;
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EID: 33745431745
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jnoncrysol.2006.01.027 Document Type: Article |
Times cited : (12)
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References (13)
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