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Volumn 352, Issue 9-20 SPEC. ISS., 2006, Pages 1348-1351

Thickness dependence of the structure of a-C:H thin films prepared by rf-CVD evidenced by Raman spectroscopy

Author keywords

Carbon; Chemical vapor deposition; Diamond like carbon; Raman scattering

Indexed keywords

AMORPHOUS FILMS; BENZENE; CARBON; CHEMICAL VAPOR DEPOSITION; HYDROGENATION; RAMAN SPECTROSCOPY; SUBSTITUTION REACTIONS;

EID: 33745431745     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2006.01.027     Document Type: Article
Times cited : (12)

References (13)
  • 2
    • 33745461494 scopus 로고    scopus 로고
    • S. Tóth, M. Veres, M. Füle, M. Koós, Diamond Relat. Mater., in press.
  • 3
    • 33745435421 scopus 로고    scopus 로고
    • S. Tóth, M. Veres, M. Füle, M. Koós, J. Non-Cryst. Solids, these Proceedings, doi:10.1016/j.jnoncrysol.2005.10.028.
  • 5
    • 33745443608 scopus 로고    scopus 로고
    • M. Koós, M. Veres, S. Tóth, M. Füle, Raman spectroscopy of CVD carbon thin films excited by near-infrared light, in: G. Messina, S. Santangelo (Eds.), Carbon: The Future Material for Advanced Technology Applications, Springer' Series Topics in Applied Physics, 2005, p. 415.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.