TEM characterization of nanostructured MgAl 2O 4 synthesized by a direct conversion process from γ-Al 2O 3

Journal of the American Ceramic Society

Volumn 89, Issue 7, 2006, Pages 2279-2285

  Al Sharab, Jafar F ^a,d   Cosandey, Frederic ^a,d   Singhal, Amit ^b   Skandan, Ganesh ^b   Bentley, James ^c,d  

^a The State University of New Jersey   (United States)

^b NEI Corporation   (United States)

^c OAK RIDGE NATIONAL LABORATORY   (United States)

^d AMERICAN CERAMIC SOCIETY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION INTENSITIES; DIRECT CONVERSION PROCESS; PHASE FORMATION; SELECTED AREA ELECTRON DIFFRACTION (SAED);

ANNEALING; ELECTRON ENERGY LOSS SPECTROSCOPY; LATTICE CONSTANTS; MAGNESIUM COMPOUNDS; PHASE TRANSITIONS; SYNTHESIS (CHEMICAL); TRANSMISSION ELECTRON MICROSCOPY;

NANOSTRUCTURED MATERIALS;

EID: 33745324026     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2006.01020.X     Document Type: Article

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